Author - Laung-Terng Wang
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Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
EAN 9780123743640 92.13 USD -
System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
EAN 9780123739735 72.89 USD -
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
EAN 9780123705976 83.61 USD